Muestra la distribución de la producción WoS, Scopus y SciELO del autor.
Publicaciones WoS (Ediciones: ISSHP, ISTP, AHCI, SSCI, SCI), Scopus, SciELO Chile.
| Firmas del autor | |
| Nombre | LEON-RODRIGUEZ, MIGUEL |
| Género | Hombre |
| Área Principal WOS | Optics; |
| Afiliación Principal | Universidad De Santiago De Chile |
| ORCID
|
0000-0003-1309-2226 |
Publicaciones en Chile
Citas Totales
Afiliaciones Chilenas
| WOS | #Pub |
|---|---|
| Optics | 3 |
| Scopus | #Pub |
|---|---|
| Atomic And Molecular Physics, And Optics | 3 |
| Engineering (All) | 2 |
| Electrical And Electronic Engineering | 1 |
| Engineering (Miscellaneous) | 1 |
| SciELO | #Pub |
|---|
| Autor | Género | # Pub |
|---|---|---|
| CORDERO-CARRASCO, RAUL RODRIGO | Hombre | 4 |
| LABBE-ZEPEDA, FERNANDO | Hombre | 2 |
| RAYAS, JUAN A. | Hombre | 4 |
| Institución | # Pub |
|---|---|
| Universidad De Santiago De Chile | 5 |
| Univ Politecn Bicentenario | 4 |
| Centro De Investigaciones En Optica, A.C. | 4 |
| Universidad Politécnica Del Bicentenario | 4 |
| Ctr Invest Opt Ac | 2 |
| Univ Politecn Guanajuato | 2 |
| Universidad Politecnica De Guanajuato | 2 |
| Ctr Invest Opt | 1 |
| Año | Firma | Institución (Incites asoc.) | H Index | Average Percentile | Impact Citation | Impact Relative World | Impact Journal Normalized Citation | Impact Category Normalized Citation | Percentage Cited | Percentage Top 1 | Percentage Top 10 | Percentage Journal Q1 | Percentage Journal Q2 | Percentage Journal Q3 | Percentage Journal Q4 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 2019 | Leon-Rodriguez, Miguel | Universidad de Santiago de Chile | 2.0 | 78.0 | 1.5 | 0.2 | 0.6 | 0.3 | 50.0 | 0.0 | 0.0 | 0.0 | 0.0 | 66.7 | 33.3 |
| 2019 | Leon-Rodriguez, M. | Universidad de Santiago de Chile | 0.0 | 100.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 |
| 2024 | Leon-Rodriguez, Miguel | Univ Politecn Guanajuato | 7.0 | 30.8 | 0.0 | 0.4 | 0.0 | 0.0 | 0.0 | 0.0 | 0.0 | 14.3 | 0.0 | 0.0 | 0.0 |
| Palabra Clave | #Pub |
|---|---|
| topography | 4 |
| accuracy | 2 |
| resolution | 2 |
| microscopy | 2 |
| shot-noise | 2 |
| talbot and self-imaging effects | 2 |
| illumination | 2 |
| holography | 2 |
| fringe projection | 2 |
| digital holography | 2 |
| uncertainty analysis | 1 |
| surface metrology | 1 |
| 3d shape recovery | 1 |
| shape measurement | 1 |
| sensors | 1 |
| variable resolution | 1 |
| reconstruction | 1 |
| ray aberration | 1 |
| patterns | 1 |
| object | 1 |
| mirrors | 1 |
| lenses | 1 |
| interferometry | 1 |
| interferometer | 1 |
| gates' interferometer | 1 |
| fourier-transform method | 1 |
| displacements | 1 |