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| DOI | 10.1364/AO.55.002160 | ||||
| Año | 2016 | ||||
| Tipo | artículo de investigación |
Citas Totales
Autores Afiliación Chile
Instituciones Chile
% Participación
Internacional
Autores
Afiliación Extranjera
Instituciones
Extranjeras
In the Hartmann test, a wave aberration function W is estimated from the information of the spot diagram drawn in an observation plane. The distance from a reference plane to the observation plane, the Hartmann-plane distance, is typically chosen as z = f, where f is the radius of a reference sphere. The function W and the transversal aberrations {X, Y} calculated at the plane z = f are related by two well-known linear differential equations. Here, we propose two nonlinear differential equations to denote a more general relation between W and the transversal aberrations {U, V} calculated at any arbitrary Hartmann-plane distance z = r. We also show how to directly estimate the wavefront surface w from the information of {U, V}. The use of arbitrary r values could improve the reliability of the measurements of W, or w, when finding difficulties in adequate ray identification at z = f. (C) 2016 Optical Society of America
| Ord. | Autor | Género | Institución - País |
|---|---|---|---|
| 1 | Tellez-Quinones, Alejandro | Hombre |
Ctr Invest Opt AC - México
Centro de Investigaciones en Optica, A.C. - México |
| 2 | Malacara-Doblado, Daniel | Hombre |
Ctr Invest Opt AC - México
Centro de Investigaciones en Optica, A.C. - México |
| 3 | Flores-Hernandez, Ricardo | Hombre |
Ctr Invest Opt AC - México
Centro de Investigaciones en Optica, A.C. - México |
| 4 | Gutierrez-Hernandez, David A. | Hombre |
Inst Tecnol Leon - México
Instituto Tecnológico de León - México |
| 5 | Leon-Rodriguez, Miguel | Hombre |
Ctr Invest Opt AC - México
Universidad de Santiago de Chile - Chile Univ Politecn Bicentenario - México Centro de Investigaciones en Optica, A.C. - México Universidad Politécnica del Bicentenario - México |