The present work it is make a to review of the simplified methods of the X-ray diffraction peak profile analysis of as a powerful tool for the characterization of the structure of polycrystaline materials and to show an example of use of that methods. The considered methods are those of the traditional and modified Williamson-Hall and Warren-Averbach methods. The use of these methods for obtains stacking fault probability, dislocation contrast factors and crystallite size distribution is shown. The methods are applied to a Cu-5 wt.% Cr processed by means mechanical alloying and to a manganese steel obtained by means conventional melting and cold deformed in compression. © 2013 Universidad Simón Bolívar.