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| Indexado |
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| DOI | 10.1007/S00339-019-2645-2 | ||||
| Año | 2019 | ||||
| Tipo | artículo de investigación |
Citas Totales
Autores Afiliación Chile
Instituciones Chile
% Participación
Internacional
Autores
Afiliación Extranjera
Instituciones
Extranjeras
Carbon nanowalls were prepared on silicon substrates by radio frequency magnetron sputtering under an argon-hydrogen mixture, at different hydrogen fluxes and varying the substrate temperature and deposition times. Scanning and transmission electron microscopy showed that carbon films deposited at 510 degrees C are nanostructured polycrystalline carbon nanowalls with crystals of about 3nm inside the flakes. The hydrogen flow induces the growth of nanowalls oriented perpendicularly to the substrate, and the density (amount) of these nanowalls decrease as the hydrogen flow increases. Field emission measurements showed that carbon nanowalls grown in hydrogen have a turn-on voltage of 2.0V/mu m, lower than those grown in pure argon with 4.5V/mu m.
| Ord. | Autor | Género | Institución - País |
|---|---|---|---|
| 1 | Guzman-Olivos, Fernando | Hombre |
Universidad Católica del Norte - Chile
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| 2 | GONZALEZ-ARANDA, RODRIGO ANDRES | Hombre |
Universidad de Chile - Chile
|
| 3 | FUENZALIDA-ESCOBAR, VICTOR MANUEL | Hombre |
Universidad de Chile - Chile
|
| 4 | Morell, G. | Hombre |
UNIV PUERTO RICO - Estados Unidos
University of Puerto Rico - Puerto Rico Universidad de Puerto Rico - Puerto Rico |
| Fuente |
|---|
| FONDECYT |
| Fondo Nacional de Desarrollo Científico y Tecnológico |
| Fondo Nacional de Desarrollo Científico, Tecnológico y de Innovación Tecnológica |
| Fondo Nacional de Desarrollo CientÃfico, Tecnológico y de Innovación Tecnológica |
| Agradecimiento |
|---|
| This work was supported for Postdoctoral Fondecyt Project No 3140565 and Fondecyt No 1150652. The authors would like to thank Dr. Frank Mendoza for his support in the Field Emission characterization. |
| Acknowledgements This work was supported for Postdoctoral Fond-ecyt Project N°3140565 and Fondecyt N°1150652. The authors would like to thank Dr. Frank Mendoza for his support in the Field Emission characterization. |