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| DOI | 10.1088/1742-6596/370/1/012060 | ||||
| Año | 2012 | ||||
| Tipo | proceedings paper |
Citas Totales
Autores Afiliación Chile
Instituciones Chile
% Participación
Internacional
Autores
Afiliación Extranjera
Instituciones
Extranjeras
The presence of metallic deposition and oxides at the surface of insulators used in plasma focus discharges is expected to have a significant effect in the conditioning process that leads to neutrons and hard x-rays emissions. In this work, the atomic concentrations of the main elements present in these insulators are studied by energy dispersive x-ray (EDX) analysis. Preliminary results are presented. Surface oxidation was observed after the conditioning process. A significant concentration of metallic deposition from the anode is observed after a working cycle of a thousand shots.
| Ord. | Autor | Género | Institución - País |
|---|---|---|---|
| 1 | TARIFENO-SALDIVIA, ARIEL ESTEBAN | Hombre |
Comision Chilena de Energia Nuclear - Chile
Centro de Investigacion y Aplicaciones en Fisica de Plasmas y Tecnologias de Potencia Pulsada - Chile Center for Research and Applications in Plasma Physics and Pulsed Power - Chile |
| 2 | Ramos Moore, Esteban | Hombre |
Pontificia Universidad Católica de Chile - Chile
|
| 3 | Ferrari, P. | Hombre |
Pontificia Universidad Católica de Chile - Chile
|
| 4 | SOTO-NORAMBUENA, LEOPOLDO ALEJANDRO | Hombre |
Comision Chilena de Energia Nuclear - Chile
Centro de Investigacion y Aplicaciones en Fisica de Plasmas y Tecnologias de Potencia Pulsada - Chile Center for Research and Applications in Plasma Physics and Pulsed Power - Chile |
| 5 | Bilbao, L | - | |
| 6 | Minotti, F | - | |
| 7 | Kelly, H | - |